Lucid Imaging debuts in the US
The Indian inspection system specialist collaborates with Berkeley Machinery to install its first machine at ImageWorx.
India-based inspection system manufacturer Lucid Imaging has marked its first entry into the North American market with the installation of its OptiCheck Label system at Imageworx in Levittown, Pennsylvania.
Marketed in the US under the brand name SureMax, the label inspection and defect detection system has been integrated directly onto a slitter rewinder supplied by Berkeley Machinery. The combined setup is configured to deliver high-speed, high-precision label inspection designed to meet rigorous production standards for domestic converters.
The OptiCheck Label (SureMax) system is engineered to perform continuous, high-resolution defect detection alongside variable data verification. According to Lucid Imaging, the technology aims to set new operational benchmarks for accuracy, reliability and performance within the label inspection segment.
Commenting on the ease of operations, Perry Strauss, chief operator at Imageworx Innovation Center, noted that the new setup stands out for its accessibility. 'The Lucid Imaging system is the most user-friendly imaging system that I have operated. The functions on the system are very easy to grasp. Other competitor systems are more proprietary in their functions and their usage.'
He further added: 'Being able to go online to a catalog of jobs we have ever run to check the errors that may have gone past or check who approved those errors is very essential to us in this business. And the OptiCheck system enables us to do that very easily.'
This initial project serves as Lucid Imaging's strategic first step toward establishing a dedicated physical presence in North America. Talking about the company's expansion, Dheeraj Kumar, product manager at Lucid Imaging, said: 'The deployment reflects our company's broader commitment to providing international converters with cutting-edge quality control and automated inspection technologies.'
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